Effect of Nitrogen Inclusion into Hf-Al-O Layer on Device Properties of Pt/SrBi2Ta2O9/Hf-Al-O/Si Diodes

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ژورنال

عنوان ژورنال: Journal of the Japan Society of Powder and Powder Metallurgy

سال: 2008

ISSN: 0532-8799,1880-9014

DOI: 10.2497/jjspm.55.17